About this book Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: **Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; **Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; **Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries. Table of contents Preface. About the Authors. I: Introduction to Testing. 1. Introduction. 2. VLSI Testing Process and Test Equipment. 3. Test Economics and Product Quality. 4. Fault Modeling. II: Test Methods. 5. Logic and Fault Simulation. 6. Testability Measures. 7. Combinational Circuit Test Generation. 8. Sequential Circuit Test Generation. 9. Memory Test. 10. DSP-Based Analog and Mixed-Signal Test. 11. Model-Based Analog and Mixed-Signal Test. 12. Delay Test. 13. IDDQ Test. III: Design for Testability. 14. Digital DFT and Scan Design. 15. Built-In Self-Test. 16. Boundary Scan Standard. 17. Analog Test Bus Standard. 18. System Test and Core-Based Design. 19. The Future of Testing. A: Cyclic Redundancy Code Theory. B: Primitive Polynomials of Degree 1 to 100. C: Books on Testing. Bibliography. Index.